Specification parameter（SM）
parameter | Unit | MEMS M×N-SM | |
operating wavelength | nm | O/C/L/L+ band | |
Wavelength of test | nm | 1310/1550/1625/1650 | |
insertion loss | dB | @CWL Single-band ≤1.6 (M≤8, N≤8) ≤2.0 (M≤16, N≤16) ≤2.6 (M≤32, N≤32) ≤3.0 (M≤64, N≤64) | @CWL Dual-band ≤2.0 (M≤8, N≤8) ≤2.4 (M≤16, N≤16) ≤3.0 (M≤32, N≤32) ≤3.4 (M≤64, N≤64) |
Wavelength dependent loss | dB | ≤0.6 | |
polarization dependent loss | dB | ≤0.3 | |
Return loss | dB | ≥45 | |
crosstalk | dB | ≥50 | |
repeatability | dB | ≤±0.1 | |
switching time | ms | ≤15 | |
lifetime | times | ≥109 | |
Maximum optical power | mW | ≤500 | |
working voltage | V | DC 5V±10% | |
working current | A | ≤0.5 (M+N≤16) ≤0.8 (M+N≤32) ≤2.0 (M+N≤64) ≤4.0 (M+N≤128) | |
operating temperature | °C | -5 ~ +75 | |
storage temperature | °C | -40 ~ +85 | |
Package size | mm | M1: 200×180×18 ±0.2 (M+N≤32) custom-made：32<M+N≤128 | |
1. All parameters were tested under a room temperature working environment. 2. All parameters do not include the insertion loss of the connector. 3. The wavelength-dependent loss test range is ±20nm. | |||
Specification parameter（MM）
parameter | Unit | MEMS M×N-MM | |
operating wavelength | nm | 850±30, 1310±30 | |
Wavelength of test | nm | 850/1310 | |
insertion loss | dB | @CWL Single-band ≤1.6 (M≤12, N≤12) ≤2.0 (M≤16, N≤16) | @CWL Dual-band ≤2.0 (M≤12, N≤12) ≤2.4 (M≤16, N≤16) |
Wavelength dependent loss | dB | ≤0.6 | |
polarization dependent loss | dB | ≤0.4 | |
Return loss | dB | ≥30 | |
crosstalk | dB | ≥30 | |
repeatability | dB | ≤±0.1 | |
switching time | ms | ≤15 | |
lifetime | times | ≥109 | |
Maximum optical power | mW | ≤500 | |
working voltage | V | DC 5V±10% | |
working current | A | ≤0.5 (M+N≤16) ≤0.8 (M+N≤32) | |
operating temperature | °C | -5 ~ +70 | |
storage temperature | °C | -40 ~ +85 | |
Package size | mm | M1: 200×180×18 ±0.2 (M+N≤32) | |
1. All parameters were tested under a room temperature working environment. 2. All parameters do not include the insertion loss of the connector. 3. The wavelength-dependent loss test range is ±20nm. | |||
OXC
OADM
Data Center
Instrumentation
